FINESSE SOLUTIONS, LLC

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 177
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7189594 Wafer level packages and methods of fabricationSep 10, 04Mar 13, 07[H01L]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2009/0104,653 Bio-process model predictions from optical loss measurementsAbandonedOct 23, 07Apr 23, 09[C12Q]
2008/0282,026 Bioprocess data managementAbandonedMay 01, 08Nov 13, 08[G06F]
2008/0144,007 Thermal lens spectroscopy for ultra-sensitive absorption measurementAbandonedNov 30, 07Jun 19, 08[G01J, G01N]
2008/0114,550 Cell density fitting equationAbandonedFeb 06, 07May 15, 08[G01N]

Top Inventors for This Owner

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